ZMetrix Impedance Test Systems
ST600 ST808
· Scanning TDR technology - New On-board Test capability
· Calibrated to NIST traceable standards - New Insertion-Loss Measurement capability
· Accurate over a wide range of measurement - New dual 10 & 20 Ghz. Bandwidth, 25 psec rise time
· Powered by a high speed USB connection - New Short Trace Measurement capability
· Single and Differential measurements - New line of High-Bandwidth Fixed-Pitch Probes
· Data collection and display software - New line of High-Bandwidth Variable-Pitch Probes
· Statistical reporting of results - Same Great ESD resistance as ST600 line